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Pattern Recognition with Support Vector Machines 2002nd ed.(Lecture Notes in Computer Science Vol.2388) P 431 p. 02

Lee, Seong-Whan, Verri, Alessandro  編
在庫状況 海外在庫有り  お届け予定日 1ヶ月  数量 冊 
価格 \15,250(税込)         

発行年月 2002年07月
出版社/提供元
出版国 アメリカ合衆国
言語 英語
媒体 冊子
装丁 paper
ページ数/巻数 XII, 428 p.
ジャンル 洋書/理工学/情報科学/人工知能
ISBN 9783540440161
商品コード 0204045451
本の性格 議事録
商品URL
参照
https://kw.maruzen.co.jp/ims/itemDetail.html?itmCd=0204045451

内容

With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude,forexample,the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over?t control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings,theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal.

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