Electronic Design Automation for IC System Design, Verification, and Testing 2nd ed. P 664 p. 18
目次
INTRODUCTION OverviewLuciano Lavagno, Grant E. Martin, Louis K. Scheffer, and Igor L. Markov Integrated Circuit Design Process and Electronic Design AutomationRobert Damiano, Raul Camposano, and Grant E. Martin Tools and Methodologies for System-Level DesignShuvra Bhattacharyya and Marilyn Wolf System-Level Specification and Modeling LanguagesStephen A. Edwards and Joseph T. Buck SoC Block-Based Design and IP AssemblyYaron Kashai Performance Evaluation Methods for Multiprocessor System-on-Chip DesignAhmed Jerraya and Iuliana Bacivarov System-Level Power ManagementNaehyuck Chang, Enrico Macii, Massimo Poncino, and Vivek Tiwari Processor Modeling and Design ToolsAnupam Chattopadhyay, Nikil Dutt, Rainer Leupers, and Prabhat Mishra Models and Tools for Complex Embedded Software and SystemsMarco Di Natale SYSTEM-LEVEL DESIGN Using Performance Metrics to Select Microprocessor Cores for IC DesignsSteve Leibson High-Level SynthesisFelice Balarin, Alex Kondratyev, and Yosinori Watanabe MICROARCHITECTURE DESIGN Back-Annotating System-Level ModelsMiltos D. Grammatikakis, Antonis Papagrigoriou, Polydoros Petrakis, and Marcello Coppola Microarchitectural and System-Level Power Estimation and OptimizationEnrico Macii, Renu Mehra, Massimo Poncino, and Robert P. Dick Design PlanningRalph H.J.M. Otten Design and Verification LanguagesStephen A. Edwards Digital SimulationJohn Sanguinetti Leveraging Transaction-Level Models in an SoC Design FlowLaurent Maillet-Contoz, Jérôme Cornet, Alain Clouard, Eric Paire, Antoine Perrin, and Jean-Philippe Strassen LOGIC VERIFICATION Assertion-Based VerificationHarry Foster and Erich Marschner Hardware-Assisted Verification and Software DevelopmentFrank Schirrmeister, Mike Bershteyn, and Ray Turner Formal Property VerificationLimor Fix, Ken McMillan, Norris Ip, and Leopold Haller TEST Design-for-TestBernd Koenemann and Brion Keller Automatic Test Pattern GenerationKwang-Ting (Tim) Cheng, Li-C. Wang, Huawei Li, and James Chien-Mo Li Analog and Mixed-Signal TestHaralampos-G. Stratigopoulos and Bozena Kaminska
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