Energy Dispersive X-ray Analysis in the Electron Microscope 2002nd ed.(Microscopy Handbooks (BIOS) Vol.46) P 160 p. 02
Garrett-Reed, Anthony,
Bell, David C.
著
|
在庫状況
お取り寄せ
|
お届け予定日
20日間
|
|
|
価格
\35,125(税込)
|
|
|
|
発行年月 |
2002年02月 |
---|
出版社/提供元 |
Garland Publishing, Inc. |
出版国 |
アメリカ合衆国 |
---|
言語 |
英語 |
---|
媒体 |
冊子 |
---|
装丁 |
paper |
---|
|
ページ数/巻数 |
160 p. |
---|
|
|
ジャンル |
洋書/理工学/化学/分析化学 |
---|
|
|
ISBN |
9781859961094 |
---|
|
商品コード |
0200242855 |
---|
|
|
|
本の性格 |
テキスト |
---|
|
新刊案内掲載月 |
2002年10月 |
---|
|
商品URL | https://kw.maruzen.co.jp/ims/itemDetail.html?itmCd=0200242855 |
---|
内容
This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.